Wed 11/11/2026 · Meeting 22
Reading: Woodward, Karen, Evans, and Vogt, Solid State Materials Chemistry
Ch. 10 §§10.2–10.4
By the end of this lecture, you will be able to:
| Substance | σ (S/m) | Substance | σ (S/m) |
|---|---|---|---|
| Ag | 6.2 × 10⁷ | Bi₂Ru₂O₇ | 2 × 10⁵ |
| Cu | 5.9 × 10⁷ | LaNiO₃ | 1 × 10⁵ |
| Al | 3.8 × 10⁷ | doped polyacetylene | 8 × 10⁴ |
| Na | 2.1 × 10⁷ | Fe₃O₄ | 2 × 10⁴ |
| ReO₃ | 1.1 × 10⁷ | YBa₂Cu₃O₇ | 1 × 10² |
| Ti | 2.5 × 10⁶ | Ge | 2 × 10⁰ |
| La | 1.6 × 10⁶ | Si | 10⁻³ |
| SrMoO₃ | 1.0 × 10⁶ | NiO | 10⁻⁸ |
| Bi | 7.7 × 10⁵ | Al₂O₃ | 10⁻¹² |
| Mn | 6.2 × 10⁵ | S | 10⁻¹⁵ |
| NbN | 4 × 10⁵ | SiO₂ (Quartz) | 10⁻¹⁶ |
| TiO | 3 × 10⁵ | Teflon | 10⁻²² |
Black dot: positively charged dopant (e.g. PSi•). Open circles: host lattice atom (e.g. Si). Dashed circle: the donated e⁻.
rd = εr (me/m*) 0.053 nm
| Eg (eV) | μe (m²V⁻¹s⁻¹) | μh (m²V⁻¹s⁻¹) | |
|---|---|---|---|
| Elements | |||
| Si | 1.11 (indirect) | 0.19 | 0.050 |
| Ge | 0.67 (indirect) | 0.38 | 0.182 |
| III–V | |||
| GaAs | 1.43 (direct) | 0.90 | 0.050 |
| InAs | 0.36 (direct) | 3.30 | 0.046 |
| InSb | 0.18 (direct) | 8.00 | 0.075 |
| II–VI | |||
| ZnS | 3.6 (direct) | 0.012 | 0.0005 |
| ZnSe | 2.58 (direct) | 0.053 | 0.0016 |
| CdTe | 1.50 (direct) | 0.030 | 0.0065 |
σ = σn + σp = nμee + pμhe
1. What is the primary reason for the low conductivity of an intrinsic (pure) semiconductor like silicon?
2. When an acceptor dopant like boron (which has one fewer valence electron than silicon) is added, what type of charge carrier is created?
3. How does the conductivity of a semiconductor generally change as temperature increases (in the intrinsic regime)?
4.In a doped semiconductor, what is the "saturation regime"?
Cross-section labels: source electrode, gate electrode, gate dielectric of thickness d, drain electrode, source n-Si, channel, drain n-Si, p-Si substrate, channel length L.
| 2006 MOSFET | 2010 MOSFET |
|---|---|
| L = 65 nm | L = 32 nm |
| d = 1.2 nm | d = ~7 nm |
| Gate dielectric: SiO₂ (εr = 3.9) | Gate dielectric: HfO₂ (εr = 30) |
| Gate electrode: n-doped Si | Gate electrode: TiN |
Metal oxide field effect transistor (MOSFET)
Cross-section labels: source electrode, gate electrode, gate dielectric of thickness d, drain electrode, source n-Si, channel, drain n-Si, p-Si substrate, channel length L.
| 2006 MOSFET | 2010 MOSFET |
|---|---|
| L = 65 nm | L = 32 nm |
| d = 1.2 nm | d = ~7 nm |
| Gate dielectric: SiO₂ (εr = 3.9) | Gate dielectric: HfO₂ (εr = 30) |
| Gate electrode: n-doped Si | Gate electrode: TiN |
1. In a p-n junction at equilibrium (no external voltage), what is the fundamental origin of the built-in electric field within the depletion region?
2. When a p-n junction is formed, the conduction and valence bands "bend" across the depletion region. What is the primary physical reason for this band bending?
3. Applying a reverse bias to a p-n junction (e.g., positive voltage to the n-type side) stops significant current flow. How does it accomplish this?
4. In an n-channel MOSFET built on a p-type substrate, how does applying a strong positive voltage to the gate electrode "turn on" the transistor?
5. Why was it necessary for the semiconductor industry to switch from silicon dioxide (SiO₂) to a high-k dielectric like hafnium oxide (HfO₂) for the gate?
After this lecture, you will be able to:
| Substance | σ (S/m) | Substance | σ (S/m) |
|---|---|---|---|
| Ag | 6.2 × 10⁷ | Bi₂Ru₂O₇ | 2 × 10⁵ |
| Cu | 5.9 × 10⁷ | LaNiO₃ | 1 × 10⁵ |
| Al | 3.8 × 10⁷ | doped polyacetylene | 8 × 10⁴ |
| Na | 2.1 × 10⁷ | Fe₃O₄ | 2 × 10⁴ |
| ReO₃ | 1.1 × 10⁷ | YBa₂Cu₃O₇ | 1 × 10² |
| Ti | 2.5 × 10⁶ | Ge | 2 × 10⁰ |
| La | 1.6 × 10⁶ | Si | 10⁻³ |
| SrMoO₃ | 1.0 × 10⁶ | NiO | 10⁻⁸ |
| Bi | 7.7 × 10⁵ | Al₂O₃ | 10⁻¹² |
| Mn | 6.2 × 10⁵ | S | 10⁻¹⁵ |
| NbN | 4 × 10⁵ | SiO₂ (Quartz) | 10⁻¹⁶ |
| TiO | 3 × 10⁵ | Teflon | 10⁻²² |
The Hubbard model considers interactions (repulsions) between electrons on the same site, while neglecting longer range electron-electron interactions. The strength of the onsite electron-electron interactions is given by the Hubbard U, which we can estimate for gas phase ions.
| Ti³⁺(g) → Ti⁴⁺(g) + e⁻ | IE of Ti³⁺ = 4th IE of Ti = 43.3 eV |
| Ti³⁺(g) + e⁻ → Ti²⁺(g) | Heg of Ti³⁺ = −(3rd IE of Ti) = −29.3 eV |
| 2 Ti³⁺(g) → Ti⁴⁺(g) + Ti²⁺(g) | U = IE + Heg = 14.0 eV |
In a solid U is smaller (2-5 eV for 3d TM ions) because:
Heg (electron gain enthalpy) is equivalent to electron affinity (with the opposite sign)
1. Which of the following best explains the dramatic difference in conductivity between NiO and TiO, despite both having the rock salt structure and partially filled d-orbitals?
2. In the context of the Hubbard model, which condition is most likely to lead to a Mott-Hubbard insulator?
3. Considering transition metal oxides with the rock salt structure (TiO, VO, MnO), why does the conductivity trend from metallic (TiO) to semiconducting (MnO) as we move across the period?
4. Strontium manganate (SrMnO₃) is a semiconductor, even though other 4+ perovskites exhibit metallic behavior. This is attributed to a particularly large Hubbard U. What characteristic of the Mn⁴⁺ (d³) electron configuration contributes to this exceptionally large U?
Work the Lecture 20 practice questions before the next class. They cover intrinsic and doped semiconductors, the p-n junction and its devices, the Hubbard model, and conductivity trends in transition metal oxides.
Open the Lecture 20 practice questions
Every question carries a worked explanation, so you can check your reasoning as you go.